英语翻译(ii) The white sample was divided intofour parts and sep

英语翻译
(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-2010).Luminescenceexperiments were carried out by exposingthe SiO2 nanowires to X-ray irradiation using a Philips set to deliver a dose of 20 Gy·min−1.Theluminescence emission of the sample was measured using a high-sensitivity multiplexed systemwith F/2.2 optics developed.Experiments were conducted at low (25\2240 K,heating rate 6K·min−1) and high (293\2673 K,heating rate 50 K·min−1) temperatures.2 Results and discussionSEM (fig.2(a)) image reveals the presence of white product on TiSi film.Under higher resolution,the white product consists of large quantities of wire-like materials and these wires arewinding,exhibiting smooth surface and uniform diameter (ca.40\290 nm).Further HRTEM examinationshows that the nanowires are amorphous (fig.2(c)) and EDX analyses indicate that theyconsist solely of silicon and oxygen (fig.2(d)).Computer analyses exhibit that the Si\4O ratio is1\42.Therefore,they are very long amorphous SiO2 nanowires.

(ii) The white sample was divided into four parts and separately wasobserved by SEM (Leo5420,10[1]20keV); by TEM (H-7100,120 keV; JEM-4000,400 keV) and by HRTEM.
(ii) 将白色样品分为四份,分别用扫描电镜（leo5420,10 20 keV）、透射电镜（H-7100,120 keV；JEM -4000,400 keV）和高分辨透射电子显微镜观察.
The compositionof the product was analyzed by energy dispersive X-ray (EDX,JEM-2010).
通过能量分散型X射线（EDX,JEM-2010）分析生成物的成分.
Luminescenceexperiments were carried out by exposing the SiO2 nanowires to X-rayirradiation using a Philips set to deliver a dose of 20 Gy•min−1.
通过飞利浦仪器提供20 Gy•min−1剂量将SiO2纳米线置于X射线照射下进行了发光实验.
Theluminescence emission of the sample was measured using a high-sensitivitymultiplexed system with F/2.2 optics developed.
用开发的带F / 2.2光学器件的高灵敏度多路复用系统测量了样品的荧光发射.
Experimentswere conducted at low (25 240 K,heating rate 6K•min−1)and high (293 673 K,heating rate 50 K•min−1)temperatures.
在低温（25 240 K,加热速率6K•min−1）和高温（293 673 K,50 K•min−1）条件下进行了实验.
2.Results anddiscussion
2.结果与讨论
SEM (fig.2(a))image reveals the presence of white product on TiSi film.
扫描电镜（图2（a））图像显示TiSi膜上有白色生成物.
Under higherresolution,the white product consists of large quantities of wire-likematerials and these wires are winding,exhibiting smooth surface and uniformdiameter (ca.40 90 nm).
在更高分辨率的条件下（可以看出）,白色生成物由大量的丝状材料构成,且这些线是弯曲的,有光滑的表面和均匀的直径（约40 90 nm）.
Further HRTEMexamination shows that the nanowires are amorphous (fig.2(c)) and EDX analysesindicate that they consist solely of silicon and oxygen (fig.2(d)).
用高分辨透射电子显微镜进行进一步检查表明,纳米线为非结晶的（图2（c））,而能谱分析表明,他们只是由硅和氧（图2（d））构成的.
Computeranalyses exhibit that the Si O ratio is 1 2.Therefore,they are very longamorphous SiO2 nanowires.
计算机分析表明,Si与O的比率为1:2.因此,他们是很长的非结晶SiO2纳米线.